Micropross-MP300 CL3
NFC量产测试仪
MP300 CL3 产品概览
MP300 CL3是Micropross专门为了解决产线的NFC测试问题而提出的解决方案。它支持了在13.56MHz此频率下工作的所有装置，像是无线智能卡，Micro-Modules，Reader/Writers,以及 NFC 装置。
产品特色: • Test in production of contactless smart cards, RFID tags, M2M modules, chip on tape (COT) micro modules, and NFC devices • Coverage of all protocol that matters : ISO 14443 A/B, ISO 15693, FeliCa, Mifare, B' (Innovatron), and all NFC Forum tags • Coverage of high speed communication (VHBR) in both ASK and PSK modes • Total flexibility in the definition of the test parameters (field strength, rise/fall times, modulation index, load modulation amplitude (smart card simulation), load on the DUT field (smart card simulation) • Numerous test implemented (resonance frequency, Q factor, complex impedance, field strength measurement, ...) • Ideal tool to test and personalize form factors such as ID-1 smart cards, M2M modules, tape of components (COT), NFC devices • Easy to control thanks to its open API • Numerous antennas available, including a dual PCD mode-PICC mode model • Modularity : possibility to have two MP300 CL3 on the same MP300 mother board • Modularity : possibility to have the MP300 CL3 installed together with a MP300 C3 for test of dual interface micro modules • Presence of a SAM card reader • Ideal tool to perform Mastercard CQM test requirements • Tool ready to test power transmitters in a production context, following the WPC specifications
产品特色: • Test in production of contactless smart cards, RFID tags, M2M modules, chip on tape (COT) micro modules, and NFC devices • Coverage of all protocol that matters : ISO 14443 A/B, ISO 15693, FeliCa, Mifare, B' (Innovatron), and all NFC Forum tags • Coverage of high speed communication (VHBR) in both ASK and PSK modes • Total flexibility in the definition of the test parameters (field strength, rise/fall times, modulation index, load modulation amplitude (smart card simulation), load on the DUT field (smart card simulation) • Numerous test implemented (resonance frequency, Q factor, complex impedance, field strength measurement, ...) • Ideal tool to test and personalize form factors such as ID-1 smart cards, M2M modules, tape of components (COT), NFC devices • Easy to control thanks to its open API • Numerous antennas available, including a dual PCD mode-PICC mode model • Modularity : possibility to have two MP300 CL3 on the same MP300 mother board • Modularity : possibility to have the MP300 CL3 installed together with a MP300 C3 for test of dual interface micro modules • Presence of a SAM card reader • Ideal tool to perform Mastercard CQM test requirements • Tool ready to test power transmitters in a production context, following the WPC specifications
